LTX-Credence Delta 50 Series overview
LTX Delta Series Semiconductor Test SystemsThe Delta Series products are based on a resource-per-pin architecture which replicates a complete set of the test sy...
Manufactured byLTX-Credence
Part number or familyDelta 50 Series
Product groupSemiconductor Test Systems
Product details
Manufactured byLTX-Credence
Product groupSemiconductor Test Systems
DescriptionLTX Delta Series Semiconductor Test SystemsThe Delta Series products are based on a resource-per-pin architecture which replicates a complete set of the test system's key features (timing generators, analog references, waveform formatting, pattern memory, etc.) for each pin channel of the test system. We believe that this architecture provides for faster, simpler characterization and engineering debug of new VLSI ICs, better system timing accuracy, and simplified interfacing with computer-aided design systems. Our enVision test development software is an integral part of the Delta Series product line. The Delta Series, includes the Delta 50 and Delta/STE. The Delta 50 was designed to meet the production test requirements of newer high volume, lower cost devices such as microcontrollers. The Delta 50 has a compact design and is capable of testing 512 pins at data rates of up to 50 MHz or 256 pins at data rates of up to 100 MHz. The Delta/STE incorporates advanced Synchro mixed signal technology with Delta Series digital technology to address the test requirements of a new generation of devices with high performance analog signal interfaces to complex digital functions. These new devices are enabling the development of powerful, yet low cost consumer electronic products in areas such as multimedia and portable communications.
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LTX-Credence
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Product group
Semiconductor Test Systems
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