JMAR PRECISION SYSTEMS Disk Inspection Systems overview
(DIS) Inspection differs from measurement in that the results of the process are qualitative rather than quantitative. These systems are designed to look for de...
Manufactured byJMAR PRECISION SYSTEMS
Part number or familyDisk Inspection Systems
Product groupSpecialty Products
Product details
Manufactured byJMAR PRECISION SYSTEMS
Product groupSpecialty Products
Description(DIS) Inspection differs from measurement in that the results of the process are qualitative rather than quantitative. These systems are designed to look for defects such as contamination, chips, scratches, stains, discoloration, and other flaws. Defect inspection may be as simple as presenting the site of a potential defect to an operator for evaluation, or as sophisticated as using an image processor to automatically detect and categorize defects on a part
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JMAR PRECISION SYSTEMS
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Specialty Products
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