APPLIED TEST RESOURCES MTS-2010i overview
Cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), bo...
Manufactured byAPPLIED TEST RESOURCES
Part number or familyMTS-2010i
Product groupSpecialty Products
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Manufactured byAPPLIED TEST RESOURCES
Product groupSpecialty Products
DescriptionCost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process
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